IOP Concise Physics

IOP Concise Physics

From Astronomy to Quantum Computing, Concise Physics publishes short texts in over 30 distinct areas of physics. These books provide readers with a snapshot of current research, an introduction to key principles, a look back at historical events and people, and even delve into issues surrounding effective teaching methods. These books are aimed at researchers, students, teachers, and anyone interested in physics at all levels. The books are available for individuals in print and e-book format on this site.

Purchasing for libraries is available through the IOP at their web site: IOP Concise Physics.



Confocal Microscopy Confocal Microscopy
Jian Liu and Jiubin Tan
The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in …
Publication Date: December, 2016

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Introduction to Focused Ion Beam Nanometrology Introduction to Focused Ion Beam Nanometrology
David C. Cox
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning wit…
Publication Date: November 4, 2015

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Sarah Fearn
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides exa…
Publication Date: October, 2015

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Nanometrology Using the Transmission Electron Microscope (Nanometrology Series) Nanometrology Using the Transmission Electron Microscope (Nanometrology Series)
Vlad Stolojan
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthrough…
Publication Date: October, 2015

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Quantitative Core Level Photoelectron Spectroscopy Quantitative Core Level Photoelectron Spectroscopy
Juan A Colon Santana
This book introduces the reader to the concepts and instrumentation that emerge in an experimental approach to the photoemission process. The basic elements implemented for the technique are discussed and the geometry of the instrumentation is explai…
Publication Date: February 13, 2015

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